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Volumn , Issue , 2009, Pages 900-907

Analysis of PWM frequency control to improve the lifetime of PWM inverter

Author keywords

Tj control; Adjustable speed drive; MTTF; Power cycling capability

Indexed keywords

ADJUSTABLE SPEED DRIVES; BOND WIRE; FREQUENCY CONTROL; HIGH TORQUE; INVERTER IGBT; JUNCTION TEMPERATURES; LOW SPEED; MEAN TIME TO FAILURE; MTTF; POWER CYCLING; PWM INVERTER;

EID: 72449131823     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2009.5316129     Document Type: Conference Paper
Times cited : (15)

References (12)
  • 1
    • 34948847576 scopus 로고    scopus 로고
    • Junction temperature prediction of a multi-chip IGBT module under DC condition
    • Oct, Florida, USA
    • Lixiang Wei, Russ J Kerkman, and etc, "Junction temperature prediction of a multi-chip IGBT module under DC condition ", in proc. IEEE IAS'2006, Oct. 2007, Florida, USA.
    • (2006) proc. IEEE IAS
    • Wei, L.1    Kerkman, R.J.2    and etc3
  • 3
    • 3042769286 scopus 로고    scopus 로고
    • MTTF prediction and design of reliability tests for high power devices in automotive applications
    • Dec
    • Mauro Ciappa, Flavio Carbognani, Wolfgang Fichner, " MTTF prediction and design of reliability tests for high power devices in automotive applications, IEEE Trans. on Device and Materials Reliability, Vol.3, No.4, Dec, 2003, pp.191-196
    • (2003) IEEE Trans. on Device and Materials Reliability , vol.3 , Issue.4 , pp. 191-196
    • Ciappa, M.1    Carbognani, F.2    Fichner, W.3
  • 4
    • 0027814190 scopus 로고    scopus 로고
    • Failure mechanism models for cyclic fatigue
    • Dec
    • Abhijit Dasgupta, " Failure mechanism models for cyclic fatigue", IEEE Transactions on Reliability, Vol.42, No.4, 1993, Dec. 2007.
    • (2007) IEEE Transactions on Reliability , vol.42 , Issue.4 , pp. 1993
    • Dasgupta, A.1
  • 6
    • 57949103049 scopus 로고    scopus 로고
    • Fast power cycling test for IGBT modules in traction application
    • Georgia, USA
    • M. Held, P. Jacod, P.Scacco, and M. Poech, "Fast power cycling test for IGBT modules in traction application ", in proc IEEE APEC 1997, Georgia, USA.
    • (1997) proc IEEE APEC
    • Held, M.1    Jacod, P.2    Scacco, P.3    Poech, M.4
  • 7
    • 3042769286 scopus 로고    scopus 로고
    • Lifetime prediction and design of reliability tests for high power devices in automotive applications
    • Dec
    • Mauro Ciappa, Flavio Carbognani, Wolfgang Fichtner,: " Lifetime prediction and design of reliability tests for high power devices in automotive applications", IEEE Trans. on Device and Materials reliability, Vol.3, No.4, Dec, 2003
    • (2003) IEEE Trans. on Device and Materials reliability , vol.3 , Issue.4
    • Ciappa, M.1    Carbognani, F.2    Fichtner, W.3
  • 8
    • 0027814190 scopus 로고    scopus 로고
    • Failure machanism models for cyclic fatigue
    • Dec
    • Abhijit Dasgupta, " Failure machanism models for cyclic fatigue", IEEE Trans. on Reliability, Vol. 42, No.4, Dec, 1993
    • (1993) IEEE Trans. on Reliability , vol.42 , Issue.4
    • Dasgupta, A.1
  • 11
    • 0032761278 scopus 로고    scopus 로고
    • Simple analytical and graphical methods for carrier based PWM VSI drives
    • Jan
    • Ahmet M. Hava, Russel J Kerkman, and Thomas A. Lipo, " Simple analytical and graphical methods for carrier based PWM VSI drives", IEEE Trans. on Power Electronics, Vol.14, No.1, Jan, 1999, pp.49-61
    • (1999) IEEE Trans. on Power Electronics , vol.14 , Issue.1 , pp. 49-61
    • Hava, A.M.1    Kerkman, R.J.2    Lipo, T.A.3
  • 12
    • 78650140795 scopus 로고    scopus 로고
    • the analysis of IGBT power cycling capability for adjustable speed drives
    • Oct, Alberta, CA
    • Lixiang Wei, Russ J Kerkman, and Richard A Lukaszewski, "the analysis of IGBT power cycling capability for adjustable speed drives", in proc. IEEE IAS'2008, Oct. 2008, Alberta, CA.
    • (2008) proc. IEEE IAS
    • Wei, L.1    Kerkman, R.J.2    Lukaszewski, R.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.