Hardness evaluation of nanolayered PVD coatings using nanoindentation

Reviews on Advanced Materials Science

Volumn 7, Issue 2, 2004, Pages 83-90

  Carneiro, J O ^a   Teixeira, V ^a   Portinha, A ^a   Dub, S N ^b   Shmegera, R ^b  

^a UNIVERSITY OF MINHO   (Portugal)

^b BAKUL INSTITUTE FOR SUPERHARD MATERIALS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CORROSION PROTECTION; ELASTIC MODULI; GROWTH (MATERIALS); HARDNESS; INDENTATION; MAGNETRON SPUTTERING; NICKEL ALLOYS; PHYSICAL VAPOR DEPOSITION; WEAR RESISTANCE; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

NANOINDENTATION; NANOLAMINATED COATINGS; NANOLAYERED COATINGS; REACTIVE MAGNETRON SPUTTERING;

CERAMIC COATINGS;

EID: 7244252852     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. Robert A. Miller // Surface and Coatings Technology 30 (1987) 13.
2. V. Teixeira, M. Andritschky, W. Fischer, H. P. Buchkremer and D. Stöver // Surface and Coatings Technology 120-121 (1999) 103.
3. V. Teixeira and M. Andritschky // High Temperature-High-Pressures 25 (1993) 213.
4. H. G. Scott // J. Mat. Sci. 10 (1975) 15227.
5. P. Gao, L. J. Meng, M.P dos Santos, V. Teixeira and M. Andritschky // Applied Surface Science 173 (2001) 84.
6. S. B. Qadri, C. M. Gilmore, C. Quinn, E. F. Skelton and C. R. Gosset // J. Vac. Sci. Technol. A 7 (1989) 1220.
7. B. E. Yoldas // J. Mat. Sci. 21 (1986) 1080.
8. C. R. Aita, M. D. Wiggins, R. Whig, C. M. Scanian and M. Gajdardziska-Josifovska // J. Appl. Phys. 79 (1996) 1176.
9. A. Handbuch der Materialkunde für den Maschinenbau (Springer, Berlin, 1898) p. 234.
10. M. Klein, Einführung in die DIN-Nermen (Teubner Verlag, Stuttgart, 1997).
11. M. F. Doerner and W. D. Nix // J. Mater. Res. 1 (1986) 43.
12. W. C. Olivier and G. M. Pharr // J. Mater. Res. 7 (1992) 1564.
13. E. Meyer // Zeitschrift Verein Deutscher Ingenieure 52 (1908) 645, in German.
14. G. Simmons and H. Wang, Single Crystal Elastic Constant and Calculated Aggregate Properties: A Hanbook 2nd ed (The M.I.T. Press, Cambridge, Massachusetts, 1971).
15. S. Dub, N. Novikov and Y. Milman // Phil. Mag. A 82 (2002) 2161.
16. N. V. Novikov, S.N. Dub, Yu. V. Milman, I.V. Gridneva and S.I. Chugunova // J. Superhard Mater. 3 (1996) 32.
17. H. E. Boyer and T. L. Gall, Metals Handbook (American Society for Metals, Metals Park, Ohio, 1985).
18. V. Teixeira, A. Monteiro, J. Duarte and A. Portinha // Vacuum 67 (2002) 477.
19. F. F. Lange // J. Mat. Sci 17 (1982) 225.
20. M. Gajdardziska-Josifovska and C. R. Aita // J. Appl. Phys. 79 (1996) 1996.
21. G.G. Stoney // Proc. R. Soc. (Lond.) A 82 (1909) 172.
22. P.M. Ramsey, H. W. Chandler and T. F. Page // Surf. Coat. Technol. 43-44 (1990) 223.
23. I. C. Noyan and, J. B. Cohen, Residual Stress: measurement by X-ray diffraction and interpretation (Springer Verlag, Berlin, 1987).
24. R. Venkatraman, J.C. Bravman, W. D. Nix. P. Davies, P.A. Flinn and D.B.J. Fraser // Electron. Mater. 10 (1990) 1231.
25. M. Kobrinsky and C.V. Thompson // Acta Mater. 48 (2000) 625.
26. E. Chu, Y.L. Shen and S. Suresh, Lexcom Report (Massachusetts Institute of Technology, Cambridge, MA, 1996).
27. A. Portinha, V. Teixeira, J. Carneiro, S.N. Dub and R. Shmegera // Rev. Adv. Mat. Sci 5 (2003) 311.