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Volumn 332, Issue 3-4, 2004, Pages 286-290
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Gallium antisite defect and residual acceptors in undoped GaSb
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Author keywords
Coincidence Doppler broadening; Defect; GaSb; Positron annihilation
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Indexed keywords
BINARY ALLOYS;
DEFECTS;
DOPPLER EFFECT;
ELECTRONS;
GALLIUM;
GALLIUM COMPOUNDS;
III-V SEMICONDUCTORS;
POSITRON ANNIHILATION;
POSITRON ANNIHILATION SPECTROSCOPY;
POSITRONS;
ANTI-SITE DEFECT;
CHARGE STATE;
COINCIDENCE DOPPLER BROADENING;
GASB;
P-TYPE CONDUCTION;
POSITRON LIFETIME SPECTROSCOPY;
RESIDUAL ACCEPTORS;
RESIDUAL CARRIER DENSITY;
ANTIMONY COMPOUNDS;
ANTIMONY;
GALLIUM;
ARTICLE;
BINDING SITE;
COLOR ULTRASOUND FLOWMETRY;
CONDUCTANCE;
CORRELATION ANALYSIS;
DENSITY GRADIENT;
ELECTRICITY;
MOLECULAR DYNAMICS;
MOLECULAR INTERACTION;
MOLECULAR MECHANICS;
POSITRON;
REACTION ANALYSIS;
SAMPLING;
SPECTROSCOPY;
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EID: 7244245836
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physleta.2004.09.056 Document Type: Article |
Times cited : (29)
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References (24)
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