Precise measurement of the fraction of charged dots in self-assembled quantum dot ensembles using ultrafast pump-probe techniques

Applied Physics Letters

Volumn 85, Issue 12, 2004, Pages 2226-2228

  Tartakovskii, A I ^a   Makhonin, M N ^a,b   Cahill, J ^a   Whittaker, D M ^a   Wells, J P R ^a   Fox, A M ^a   Mowbray, D J ^a   Skolnick, M S ^a   Steer, M J ^a   Groom, K M ^a   Hopkinson, M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DATA RECORDING; LASER PULSES; LIGHT POLARIZATION; MOLECULAR BEAM EPITAXY; OSCILLATIONS; PHOTOLUMINESCENCE; SELF ASSEMBLY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

DIFFERENTIAL TRANSMISSION (DT); GAUSSIAN DISTRIBUTIONS; NONOSCILLATING SIGNAL DECAYING; SELF-ASSEMBLY TECHNIQUES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 7244245519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1796524     Document Type: Article

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