FEM versus BEM

IEEE Circuits and Devices Magazine

Volumn 20, Issue 5, 2004, Pages 25-34

  Liao, Yunn Shiuan ^a   Chyuan, Shiang Woei ^a   Chen, Jeng Tzong ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTROSTATICS; FINITE ELEMENT METHOD; MATHEMATICAL MODELS;

DIELECTRIC BREAKDOWN; DIELECTRIC STRENGTH; EXTERIOR ELECTROSTATIC PROBLEMS;

ELECTRON DEVICES;

EID: 7244232526     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCD.2004.1343246     Document Type: Article

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