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1
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0029516983
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Ultraviolet damage properties of various fused silica materials
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R. E. Schenker, L. Eichner, H. Vaidya, S. Vaidya, P. M. Schermerhorn, D. R. Fladd, and W. G. Oldham, "Ultraviolet damage properties of various fused silica materials," Proc. SPIE 2428, 458-468 (1994).
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2
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0014348985
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The radiation compaction of vitreous silica
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4
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0030082106
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Calorimetric measurement of two-photon absorption and color-center formation in ultraviolet-window materials
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E. Eva, and K. Mann, "Calorimetric measurement of two-photon absorption and color-center formation in ultraviolet-window materials," Appl. Phys., A Mater. Sci. Process. 62(2), 143-149 (1996).
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Eva, E.1
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5
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Novel method to measure bulk absorption in optically transparent materials
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M. Guntau, and W. Triebel, "Novel method to measure bulk absorption in optically transparent materials," Rev. Sci. Instrum. 71(6), 2279-2282 (2000).
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6
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0036506655
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Comparative studies of absorptance behaviour of alkaline-earth fluorides at 193 nm and 157nm
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C. Görling, U. Leinhos, and K. Mann, "Comparative studies of absorptance behaviour of alkaline-earth fluorides at 193 nm and 157nm," Appl. Phys. B 74(3), 259-265 (2002).
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Appl. Phys. B
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Görling, C.1
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7
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0031190412
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Densification of fused silica under 193-nm excitation
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N. F. Borrelli, C. Smith, D. C. Allan, and T. P. Seward, "Densification of fused silica under 193-nm excitation," J. Opt. Soc. Am. B 14(7), 1606-1625 (1997).
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8
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29744442798
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Optical Materials: Compaction and rarefaction affect photolithography system lifetimes
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J. M. Algots, C. Steinbrecher, H. Jinbo, S. Chuckravanen, "Optical Materials: Compaction and rarefaction affect photolithography system lifetimes," Laser Focus World, 41(11) (2005).
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Algots, J.M.1
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9
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85077782675
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Amplitude and phase beam characterization using a two-dimensional wavefront sensor
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D. R. Neal, W. J. Alford, J. K. Gruetzner, and M. E. Warren, "Amplitude and phase beam characterization using a two-dimensional wavefront sensor," Proc. SPIE 2870, 72 (1996).
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Neal, D.R.1
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10
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0042409339
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Investigation of the propagation characteristics of excimer lasers using a Hartmann-Shack sensor
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B. Schäfer, and K. Mann, "Investigation of the propagation characteristics of excimer lasers using a Hartmann-Shack sensor," Rev. Sci. Instrum. 71(7), 2663 (2000).
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Schäfer, B.1
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11
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0037140595
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Determination of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wave-front sensor
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B. Schäfer, and K. Mann, "Determination of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wave-front sensor," Appl. Opt. 41(15), 2809-2817 (2002).
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Schäfer, B.1
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12
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0003972070
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Cambridge University Press, 7th Ed.), Sect.15.4
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M. Born, and E. Wolf, Principles of Optics, (Cambridge University Press, 7th Ed.), Sect. 15.4, 823pp (2001)
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Born, M.1
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