Amplitude and phase beam characterization using a two-dimensional wavefront sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2870, Issue , 1996, Pages 72-82

  Neal, Daniel R ^a   Alford, W J ^a   Gruetzner, James K ^a   Warren, Mial E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Beam quality; Binary optics; Diffractive optics; Laser beam characterization; Laser beam diagnostics; M2; Microlens arrays; Shack hartmann sensor; Wavefront sensor

Indexed keywords

ARGON LASERS; BEAM QUALITY; CCD CAMERAS; DIFFRACTIVE OPTICS; LASER DIAGNOSTICS; MICROOPTICS; WAVEFRONTS;

BINARY OPTICS; LASER BEAM CHARACTERIZATION; LASER BEAM DIAGNOSTICS; MICRO-LENS ARRAYS; SHACK-HARTMANN SENSOR; WAVE FRONT SENSORS;

LASER BEAMS;

EID: 85077782675     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259947     Document Type: Conference Paper

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