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Volumn 95, Issue 23, 2009, Pages

InGaN multiquantum well structure with a reduced internal electric field and carrier decay process by tunneling

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DECAY; FLATBAND CONDITIONS; INGAN/GAN; INTERNAL ELECTRIC FIELDS; MULTIQUANTUM WELL STRUCTURES; PEAK ENERGY; PL INTENSITY; PL LIFETIME; TIME-RESOLVED PHOTOLUMINESCENCE;

EID: 71949128119     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3274137     Document Type: Article
Times cited : (25)

References (18)
  • 17
    • 0037101092 scopus 로고    scopus 로고
    • 0163-1829. 10.1103/PhysRevB.66.035334
    • Y. D. Jho, J. S. Yahng, E. Oh, and D. S. Kim, Phys. Rev. B 0163-1829 66, 035334 (2002). 10.1103/PhysRevB.66.035334
    • (2002) Phys. Rev. B , vol.66 , pp. 035334
    • Jho, Y.D.1    Yahng, J.S.2    Oh, E.3    Kim, D.S.4
  • 18
    • 71949097252 scopus 로고    scopus 로고
    • 2 the efficiencies of the GaN barrier and InGaN barrier samples are reduced by 19% and 14% from their peak values, respectively
    • 2 the efficiencies of the GaN barrier and InGaN barrier samples are reduced by 19% and 14% from their peak values, respectively.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.