Explicit connection between sample geometry and Hall response

Applied Physics Letters

Volumn 95, Issue 23, 2009, Pages

  Paul, Oliver ^a   Cornils, Martin ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIASING CONDITIONS; CONTACT DEVICE; CROSS PRODUCT; DEVICE GEOMETRIES; GEOMETRIC PARAMETER; HALL RESPONSE; HALL VOLTAGE; PARAMETERIZED; PLANAR DEVICES; ROTATIONAL SYMMETRIES; SAMPLE GEOMETRY; TRANSPORT COEFFICIENT;

MAGNETIC FIELDS;

EID: 71949089623     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3272267     Document Type: Article

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