Historical perspectives on charging issues in XPS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 176, Issue 1-3, 2010, Pages 5-7

  Kelly, Michael A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 71849114863     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.10.006     Document Type: Editorial

References (17)

1. Huchital D.A., and McKeon R.T. Appl. Phys. Lett. 20 (1972) 158
2. Kelly M.A., and Tyler C.E. Hewlett Packard J. 24 11 (1973) 2
3. Lewis R.T., and Kelly M.A. J. Electron Spectrosc. Relat. Phenom. 20 (1980) 105
4. Briggs D., and Grant J.T. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (2003), IM Publications, West Sussex, UK ISBN 1901019047, (Chapter 8)
5. Unger W.E.S., et al. Surf. Interf. Anal. 29 (2000) 535
6. Barr T.L. J. Vac. Sci. Technol. A 7 3 (1989) 1677
7. Yu X., and Hantsche H. J. Electron Spectrosc. Relat. Phenom. 50 (1990) 19
8. Cazaux J. J. Electron Spectrosc. Relat. Phenom. 105 2/3 (1999) 155
9. Mukherjee S., and Mukherjee M. J. Electron Spectrosc. Relat. Phenom. 154 (2007) 90
10. Larson P.E., and Kelly M.A. J. Vac. Sci. Technol. A 16 6 (1998) 3483
11. Bryson C.E. Surf. Sci. 189/190 (1987) 50
12. Metson J.B. Surf. Interf. Anal. 27 (1999) 1069
13. A.R. Walker, S.C. Page, Electron Energy Analyzer, US Patent #5,286,974 (1994).
14. Grimm M., et al. Phys. Rev. Lett. 96 (2006) # 066801
15. Doron-Mor H., et al. Nature 406 (2000) 382
16. Suzer S. Anal. Chem. 75 (2003) 7026
17. Demirok U.K., et al. J. Phys. Chem. B 108 (2004) 5179