Optical properties of Bi2.25La0.75TiNbO9 thin films grown on fused silica substrates by PLD

Optical Materials

Volumn 32, Issue 2, 2009, Pages 406-409

  Zhang, Mingfu ^a   Yang, Bin ^a   Chen, Hengzhi ^a   Cao, Wenwu ^a,b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Bi2.25La0.75TiNbO9; Optical waveguide; Prism coupling technique; Pulsed laser deposition

Indexed keywords

BISMUTH COMPOUNDS; ELECTRIC LINES; ENERGY GAP; FERROELECTRIC FILMS; FUSED SILICA; INTERFACES (MATERIALS); INVERSE PROBLEMS; LANTHANUM COMPOUNDS; NIOBIUM COMPOUNDS; OPTICAL WAVEGUIDES; PEROVSKITE; PEROVSKITE SOLAR CELLS; PRISMS; PULSED LASER DEPOSITION; PULSED LASERS; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS; WAVEGUIDES;

BI2.25LA0.75TINBO9; FILM-SUBSTRATE INTERFACES; FUSED SILICA SUBSTRATES; PRISM COUPLING METHOD; PRISM COUPLING TECHNIQUE; TRANSVERSE ELECTRICS; TRANSVERSE MAGNETIC MODES; WAVELENGTH DEPENDENCE;

OPTICAL FILMS;

EID: 71849103619     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2009.08.003     Document Type: Article

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