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Volumn 165, Issue 1-2, 2009, Pages 67-70
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Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
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Author keywords
Diffusion length; Epitaxial silicon; LBIC; Quantum efficiency; Solar cells; Thin films
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Indexed keywords
DIFFUSION;
DIFFUSION COATINGS;
PHOTOELECTROCHEMICAL CELLS;
SILICON;
SILICON SOLAR CELLS;
DIFFUSION LENGTH;
ELECTRICAL CHARACTERIZATION;
EPITAXIAL SILICON;
INTERNAL QUANTUM EFFICIENCY;
LBIC;
LIGHT BEAM INDUCED CURRENTS;
QUANTUM EFFICIENCY MEASUREMENTS;
SURFACE RECOMBINATION VELOCITIES;
THIN SILICON LAYERS;
THIN-FILMS;
QUANTUM EFFICIENCY;
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EID: 71749119002
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2009.04.007 Document Type: Article |
Times cited : (5)
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References (20)
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