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Volumn 165, Issue 1-2, 2009, Pages 67-70

Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements

Author keywords

Diffusion length; Epitaxial silicon; LBIC; Quantum efficiency; Solar cells; Thin films

Indexed keywords

DIFFUSION; DIFFUSION COATINGS; PHOTOELECTROCHEMICAL CELLS; SILICON; SILICON SOLAR CELLS;

EID: 71749119002     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.04.007     Document Type: Article
Times cited : (5)

References (20)
  • 17
    • 0004969051 scopus 로고
    • Revue de Physique Appliquée, Colloque C6, Supplément au No. 6
    • J.P. Boyeaux, A. Laugier, Revue de Physique Appliquée, Colloque C6, Supplément au No. 6, Tome 24, 1989, p. 111.
    • (1989) Tome , vol.24 , pp. 111
    • Boyeaux, J.P.1    Laugier, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.