Structural investigations on nanocrystalline Ni-W alloy films by transmission electron microscopy

Thin Solid Films

Volumn 517, Issue 24, 2009, Pages 6593-6598

  Klimenkov, M ^a   Haseeb, A S M A ^b   Bade, K ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

Bimodal grain size; Electroplated nickel tungsten alloys; Multiple twinned particle (MTP); Nanocrystalline; Transmission electron microscopy

Indexed keywords

BIMODAL GRAINS; ELECTROPLATED NICKEL; MULTIPLE TWINNED PARTICLES; NANOCRYSTALLINE; NANOCRYSTALLINES;

CRYSTALLIZATION; ELECTRONS; GRAIN SIZE AND SHAPE; MICROSTRUCTURAL EVOLUTION; NICKEL; NICKEL ALLOYS; NICKEL PLATING; SOLID SOLUTIONS; SOLIDIFICATION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN; TUNGSTEN ALLOYS;

NANOCRYSTALLINE ALLOYS;

EID: 71749118216     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.04.039     Document Type: Article

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