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Volumn , Issue , 2009, Pages 219-223

Method for in-situ reliability testing of TIM samples

Author keywords

[No Author keywords available]

Indexed keywords

EXTERNAL COOLING; HEAT-FLOW; IN-SITU; JUNCTION TEMPERATURES; POWER SEMICONDUCTOR DEVICES; RELIABILITY TESTING; THERMAL CYCLE; THERMAL TRANSIENT MEASUREMENTS;

EID: 71749113990     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 2
    • 33750143844 scopus 로고    scopus 로고
    • Lasance, C.J.M.; Murray, C.T.; Saums, D.L.; Rencz, M. Challenges in thermal interface material testing, Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE Issue , 14-16 March 2006 Page(s):42-49, Digital Object Identifier 10.1109/STHERM.2006. 1625204
    • Lasance, C.J.M.; Murray, C.T.; Saums, D.L.; Rencz, M. "Challenges in thermal interface material testing", Semiconductor Thermal Measurement and Management Symposium, 2006 IEEE Twenty-Second Annual IEEE Volume , Issue , 14-16 March 2006 Page(s):42-49, Digital Object Identifier 10.1109/STHERM.2006. 1625204
  • 5
    • 84869677931 scopus 로고    scopus 로고
    • www.jedec.org/download/jedec/jesd51-5.pdf
  • 6
    • 0032028593 scopus 로고    scopus 로고
    • Identification of RC Networks by Deconvolution: Chances and Limits, IEEE Transactions on Circuits and Systems-I
    • V. Székely, Identification of RC Networks by Deconvolution: Chances and Limits, IEEE Transactions on Circuits and Systems-I. Theory and Applications, CAS-45 (3):244-258, 1998
    • (1998) Theory and Applications , vol.CAS-45 , Issue.3 , pp. 244-258
    • Székely, V.1
  • 7
    • 0037004307 scopus 로고    scopus 로고
    • Measuring partial thermal resistances in a heat flow path
    • Dec
    • Rencz M., Székely V.,: Measuring partial thermal resistances in a heat flow path, IEEE Transactions on CPT, Vol 25,No 4, Dec. 2002, pp 547-553
    • (2002) IEEE Transactions on CPT , vol.25 , Issue.4 , pp. 547-553
    • Rencz, M.1    Székely, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.