![]() |
Volumn 404, Issue 22, 2009, Pages 4354-4358
|
The silicon vacancy in SiC
c
Norstel AB
(Sweden)
|
Author keywords
EPR; ODMR; PL; SiC; Silicon vacancy
|
Indexed keywords
EPR;
EXPERIMENTAL DATA;
INTRINSIC DEFECTS;
NEGATIVE CHARGE;
NEW MODEL;
ODMR;
VACANCY DEFECTS;
ELECTRON RESONANCE;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
PARAMAGNETIC RESONANCE;
QUANTUM THEORY;
SILICON CARBIDE;
VACANCIES;
|
EID: 71749102803
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.09.023 Document Type: Article |
Times cited : (144)
|
References (7)
|