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Volumn 404, Issue 22, 2009, Pages 4354-4358

The silicon vacancy in SiC

Author keywords

EPR; ODMR; PL; SiC; Silicon vacancy

Indexed keywords

EPR; EXPERIMENTAL DATA; INTRINSIC DEFECTS; NEGATIVE CHARGE; NEW MODEL; ODMR; VACANCY DEFECTS;

EID: 71749102803     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.09.023     Document Type: Article
Times cited : (127)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.