Imaging the origins of coating degradation and blistering caused by electrolyte immersion assisted by SECM

Electroanalysis

Volumn 21, Issue 23, 2009, Pages 2569-2574

  Souto, R M ^a   Gonzalez Garcia Y ^a   Gonzalez S ^a   Burstein, G T ^b  

^a UNIVERSIDAD DE LA LAGUNA   (Spain)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Blister nucleation; Chloride ions; Coil coated steel; Degradation; Organic coatings; SECM

Indexed keywords

CHLORINE COMPOUNDS; ELECTROLYTES; MICROELECTRODES; ORGANIC COATINGS;

BLISTER NUCLEATION; CHLORIDE IONS; COATED METALS; COATING DEGRADATION; COATING PERFORMANCE; COIL-COATED STEEL; FEEDBACK MODE; GROWTH PROCESS; METAL SYSTEMS; SECM;

NUCLEATION;

EID: 71649111451     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.200900262     Document Type: Article

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