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Volumn 65, Issue 4, 2009, Pages 435-439

Characterization of coating systems by scanning electrochemical microscopy: Surface topology and blistering

Author keywords

Blistering; Chloride ions; Coil coated steel; Degradation; Organic coatings; Scanning electrochemical microscopy

Indexed keywords

AQUEOUS ELECTROLYTE; AQUEOUS ENVIRONMENT; BLISTERING; CHLORIDE IONS; COATED METALS; COATED SYSTEMS; COATING PERFORMANCE; COATING SURFACE; COATING SYSTEM; COIL COATED STEEL; FEEDBACK MODE; FREE ELECTROLYTES; IN-SITU; IONIC MIGRATION; NITRATE IONS; NUCLEATION AND GROWTH; REDOX MEDIATORS; SCANNING ELECTROCHEMICAL MICROSCOPES; SCANNING ELECTROCHEMICAL MICROSCOPY; SIGNIFICANT SURFACES; SULPHATE; SURFACE TOPOLOGY; TIME-SCALE;

EID: 67349095015     PISSN: 03009440     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.porgcoat.2009.03.008     Document Type: Article
Times cited : (54)

References (40)
  • 40
    • 0003853137 scopus 로고    scopus 로고
    • Bard A.J., and Mirkin M.V. (Eds), Marcel Dekker, New York
    • In: Bard A.J., and Mirkin M.V. (Eds). Scanning Electrochemical Microscopy (2001), Marcel Dekker, New York
    • (2001) Scanning Electrochemical Microscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.