Effect of solvent on PEDOT/PSS nanometer-scaled thin films: XPS and STEM/AFM studies

Synthetic Metals

Volumn 159, Issue 21-22, 2009, Pages 2225-2228

  Yan, Hu ^a   Okuzaki, Hidenori ^a  

^a UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

AFM; Colloidal dispersion; PEDOT PSS; STEM TEM; Thin film; XPS

Indexed keywords

AFM; COLLOIDAL DISPERSION; PEDOT/PSS; STEM/TEM; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DISPERSIONS; ETHYLENE; ETHYLENE GLYCOL; FILM THICKNESS; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THIN FILM DEVICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 71649099780     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2009.07.032     Document Type: Article

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