Structural characterization and anomalous dielectric behaviour of (Si3N4)x(V2O5)100-x ceramics

Physica B: Condensed Matter

Volumn 405, Issue 2, 2010, Pages 579-585

  Khan, Imran ^a   Zulfequar, M ^a  

^a JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY   (India)

Author keywords

Dielectric loss and DC conductivity; Negative dielectric constant (NDC); Structural characterization

Indexed keywords

AUDIO FREQUENCIES; BULK SAMPLES; CONDUCTION MECHANISM; CRYSTALLINE NATURE; DC CONDUCTIVITY; DIELECTRIC BEHAVIOUR; DIELECTRIC RESPONSE; ELECTRICAL PROPERTY; GRAIN SIZE; INDUCTIVE REACTANCE; NANOMETRES; NEGATIVE CAPACITANCE; NEGATIVE CAPACITANCE EFFECT; NEGATIVE DIELECTRIC; SEM; STRUCTURAL CHARACTERIZATION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; XRD;

CAPACITANCE; CERAMIC CAPACITORS; CERAMIC MATERIALS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; PERMITTIVITY; SILICON;

DIELECTRIC MATERIALS;

EID: 71549141623     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.09.069     Document Type: Article

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