Effect of microstructure on dielectric properties of Si3N 4 at microwave frequency

Key Engineering Materials

Volumn 287, Issue , 2005, Pages 247-252

  Park, Min Kyu ^a   Kim, Ha Neul ^a   Lee, Kee Sung ^b   Baek, Seung Su ^c   Kang, Eul Son ^c   Baek, Yong Kee ^c   Kim, Do Kyung ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Kookmin University   (South Korea)

^c Agency for Defence Development   (South Korea)

Author keywords

Dielectric properties; Microstructure; Microwave; Si3N4

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC PROPERTIES; HOT PRESSING; MICROSTRUCTURE; MICROWAVE FREQUENCIES;

MICROWAVE DIELECTRIC PROPERTIES; PHASE SPECIMENS; SI3N4; SILICON NITRIDE CERAMICS;

SILICON NITRIDE;

EID: 33750022111     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-965-2.247     Document Type: Conference Paper

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