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Volumn , Issue , 2009, Pages 881-884

The magnetic calibration of arbitrarily shaped Hall sensors in the absence of magnetic fields

Author keywords

Calibration; Conformal mapping; Hall sensors; Magnetic sensitivity; Sensor optimization

Indexed keywords

CMOS SENSORS; DEVICE GEOMETRIES; ELECTRICAL CONDUCTION; EXPERIMENTAL DATA; HALL PLATES; HALL SENSOR; MAGNETIC EFFECTS; MAGNETIC SENSITIVITY; NUMERICAL SIMULATION; PERPENDICULAR MAGNETIC FIELDS; PRIOR KNOWLEDGE; RESISTANCE VALUES; SENSOR OPTIMIZATION;

EID: 71449101602     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2009.5285858     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 3
    • 50149117971 scopus 로고    scopus 로고
    • The magnetic calibration and optimization of symmetric Hall plates may be accomplished even in the absence of a magnetic field
    • Tucson, January 13-17
    • M. Cornils and O. Paul, "The magnetic calibration and optimization of symmetric Hall plates may be accomplished even in the absence of a magnetic field", in Techn. Digest MEMS'08 Conference, Tucson, January 13-17, 2008, pp. 940-943.
    • (2008) Techn. Digest MEMS'08 Conference , pp. 940-943
    • Cornils, M.1    Paul, O.2
  • 5
    • 51349156783 scopus 로고    scopus 로고
    • Beyond van der Pauw: Sheet resistance determination from arbitrarily shaped planar four-terminal devices with extended contacts
    • Edinburgh, March 24-27
    • M. Cornils and O. Paul, "Beyond van der Pauw: sheet resistance determination from arbitrarily shaped planar four-terminal devices with extended contacts", in Proc. ICMTS'08 Conference, Edinburgh, March 24-27, 2008, pp. 23-28.
    • (2008) Proc. ICMTS'08 Conference , pp. 23-28
    • Cornils, M.1    Paul, O.2
  • 7
    • 48849094669 scopus 로고    scopus 로고
    • Sheet resistance determination of electrically symmetric planar four-terminal devices with extended contacts
    • 024503/10
    • M. Cornils and O. Paul, "Sheet resistance determination of electrically symmetric planar four-terminal devices with extended contacts", J. Appl. Phys, vol. 104, pp. 024503/1-024503/10, 2008.
    • (2008) J. Appl. Phys , vol.104 , pp. 024503-24511
    • Cornils, M.1    Paul, O.2
  • 8
    • 0002425321 scopus 로고
    • A method of measuring specific resistivity and Hall effect of discs of arbitrary shape
    • L. J. Van Der Pauw, "A method of measuring specific resistivity and Hall effect of discs of arbitrary shape", Philips Res. Rep., vol. 13, no. 1, pp. 1-9, 1958.
    • (1958) Philips Res. Rep , vol.13 , Issue.1 , pp. 1-9
    • Van Der Pauw, L.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.