-
1
-
-
0028513983
-
Choosing polymer-coatings for chemical sensors
-
R. A. McGill, M. H. Abraham, and J. W. Grate, "Choosing polymer-coatings for chemical sensors", Chemtech, vol. 24, pp. 27-37, 1994.
-
(1994)
Chemtech
, vol.24
, pp. 27-37
-
-
McGill, R.A.1
Abraham, M.H.2
Grate, J.W.3
-
2
-
-
0029251675
-
Vapor detection using resonating microcantilevers
-
T. Thundat, G. Y. Chen, R. J. Warmack, D. P. Allison, E. A. Wachter, "Vapor detection using resonating microcantilevers", Anal. Chem., vol. 67, pp. 519-521, 1995.
-
(1995)
Anal. Chem
, vol.67
, pp. 519-521
-
-
Thundat, T.1
Chen, G.Y.2
Warmack, R.J.3
Allison, D.P.4
Wachter, E.A.5
-
3
-
-
0034317532
-
Integrated atomic force microscopy array probe with metal-oxidesemiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metaloxide- semiconductor electronics
-
T. Akiyama, U. Staufer, N. F. de Rooij, D. Lange, C. Hagleitner, O. Brand, H. Baltes, A. Tonin, and H. R. Hidber, "Integrated atomic force microscopy array probe with metal-oxidesemiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metaloxide- semiconductor electronics," J. Vac. Sci. Technol. B, vol. 18, pp. 2669-2675, 2000.
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, pp. 2669-2675
-
-
Akiyama, T.1
Staufer, U.2
de Rooij, N.F.3
Lange, D.4
Hagleitner, C.5
Brand, O.6
Baltes, H.7
Tonin, A.8
Hidber, H.R.9
-
4
-
-
21544472129
-
Atomic resolution with an atomic force microscope using piezoresistive detection
-
M. Tortonese, R. C. Barrett, and C. F. Quate, "Atomic resolution with an atomic force microscope using piezoresistive detection," Appl. Phys. Lett. vol. 62, pp. 834-836, 1993.
-
(1993)
Appl. Phys. Lett
, vol.62
, pp. 834-836
-
-
Tortonese, M.1
Barrett, R.C.2
Quate, C.F.3
-
5
-
-
0001105231
-
Deflection detection and feedback actuating using a self-excited pieaoelectric Pb(Zr, Ti)O3 microcantilever for dynamic scanning force microscopy
-
T. Itoh, C. Lee and T. Suga, "Deflection detection and feedback actuating using a self-excited pieaoelectric Pb(Zr, Ti)O3 microcantilever for dynamic scanning force microscopy", Appl. Phys. Lett., vol. 69, pp. 2036-2038, 1996.
-
(1996)
Appl. Phys. Lett
, vol.69
, pp. 2036-2038
-
-
Itoh, T.1
Lee, C.2
Suga, T.3
-
6
-
-
0031187202
-
Development of a Piezoelectric Self-excitation and Self-detection Mechanism of PZT Microcantilevers for Dynamic SFM in liquid
-
C. Lee, T. Itoh, R. Maeda, T. Ohashi, and T. Suga, "Development of a Piezoelectric Self-excitation and Self-detection Mechanism of PZT Microcantilevers for Dynamic SFM in liquid", J. Vac. Sci. & Technol. B, vol. 15, pp. 1559-1563, 1997.
-
(1997)
J. Vac. Sci. & Technol. B
, vol.15
, pp. 1559-1563
-
-
Lee, C.1
Itoh, T.2
Maeda, R.3
Ohashi, T.4
Suga, T.5
-
7
-
-
0026913677
-
Micromachined atomic force microprobe with integrated capacitive readout
-
J. Brugger, R. A. Buser, and N. F. de Rooij, "Micromachined atomic force microprobe with integrated capacitive readout," J. Micromech. Microeng., vol. 2, pp. 218-220, 1992.
-
(1992)
J. Micromech. Microeng
, vol.2
, pp. 218-220
-
-
Brugger, J.1
Buser, R.A.2
de Rooij, N.F.3
-
8
-
-
36549096102
-
Novel optical approach to atomic force microscopy
-
G. Meyer and N. M. Amer, "Novel optical approach to atomic force microscopy", Appl. Phys. Lett, vol. 53, pp. 1045-1047, 1988.
-
(1988)
Appl. Phys. Lett
, vol.53
, pp. 1045-1047
-
-
Meyer, G.1
Amer, N.M.2
-
9
-
-
52349116375
-
Si nanophotonics based cantilever sensor
-
C. Lee, J. Thillaigovindan, C. Chen, X. T. Chen, Y. Chao, S. Tao, W. Xiang, A. Yu, H. Feng and G. Q. Lo, "Si nanophotonics based cantilever sensor", Appl. Phys. Lett., Vol. 93, pp. 113113, 2008.
-
(2008)
Appl. Phys. Lett
, vol.93
, pp. 113113
-
-
Lee, C.1
Thillaigovindan, J.2
Chen, C.3
Chen, X.T.4
Chao, Y.5
Tao, S.6
Xiang, W.7
Yu, A.8
Feng, H.9
Lo, G.Q.10
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