Influence of support material on formation of electrocatalytic thin films - A secondary ion mass spectrometry study

International Journal of Mass Spectrometry and Ion Processes

Volumn 161, Issue 1-3, 1997, Pages 141-149

  Piccirillo, C ^a   Daolio, S ^a   Kristof J ^b   Mihaly J ^b   Facchin, B ^a   Fabrizio, M ^a  

^a CNR   (Italy)

^b UNIVERSITY OF PANNONIA   (Hungary)

Author keywords

Depth profiling; Electrocatalysis; Iridium dioxide; Oxide film electrode; Ruthenium dioxide; Secondary ion mass spectrometry; Titanium dioxide

Indexed keywords

EID: 7144232113     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0168-1176(96)04531-4     Document Type: Article

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