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Volumn 161, Issue 1-3, 1997, Pages 141-149

Influence of support material on formation of electrocatalytic thin films - A secondary ion mass spectrometry study

Author keywords

Depth profiling; Electrocatalysis; Iridium dioxide; Oxide film electrode; Ruthenium dioxide; Secondary ion mass spectrometry; Titanium dioxide

Indexed keywords


EID: 7144232113     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0168-1176(96)04531-4     Document Type: Article
Times cited : (5)

References (19)
  • 19
    • 0002501491 scopus 로고
    • A. Benninghoven, K.T.F. Jansen, J. Tumpner and H.W. Werner (Eds.), Wiley, Chichester
    • C. Pagura, S. Daolio and B. Facchin, in A. Benninghoven, K.T.F. Jansen, J. Tumpner and H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS VIII, Wiley, Chichester, 1992, p. 239.
    • (1992) Secondary Ion Mass Spectrometry SIMS VIII , pp. 239
    • Pagura, C.1    Daolio, S.2    Facchin, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.