Investigation on the formation of RuO2 film electrode by secondary ion mass spectrometry

Surface Science

Volumn 348, Issue 3, 1996, Pages 287-298

  Kristof J ^a   Daolio, S ^b   Piccirillo, C ^b   Facchin, B ^b   Mink, J ^a,c  

^a UNIVERSITY OF PANNONIA   (Hungary)

^b CNR   (Italy)

^c INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

Depth profiling; Electrocatalysis; Oxide film electrode; Ruthenium dioxide; Secondary ion mass spectroscopy

Indexed keywords

CALCINATION; CATALYSIS; COATINGS; DIFFUSION; FILMS; HYDRATION; NICKEL; RUTHENIUM COMPOUNDS; SECONDARY ION MASS SPECTROMETRY; STRUCTURE (COMPOSITION); THERMAL EFFECTS; TITANIUM;

DEPTH PROFILING; ELECTROCATALYSIS; OXIDE FILM ELECTRODE; RUTHENIUM DIOXIDE;

ELECTROCHEMICAL ELECTRODES;

EID: 0030105511     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01026-2     Document Type: Article

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