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Volumn 152, Issue 1, 1996, Pages 87-96

Secondary ion mass spectrometry studies on the formation of the valve metal oxide in ruthenium- and iridium-based mixed oxide electrodes

Author keywords

Depth profiling; Electrocatalysis; Mixed oxide coatings; Secondary ion mass spectrometry; Titanium dioxide

Indexed keywords


EID: 3743076453     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-1176(95)04331-4     Document Type: Article
Times cited : (6)

References (14)
  • 14
    • 0002501491 scopus 로고
    • A. Benninghoven, K.T.F. Jansen, J. Tumpner and H.W. Werner (Eds.), Wiley, Chichester
    • C. Pagura, S. Daolio, B. Facchin, in A. Benninghoven, K.T.F. Jansen, J. Tumpner and H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS VIII, Wiley, Chichester, 1992, p. 239.
    • (1992) Secondary Ion Mass Spectrometry SIMS VIII , pp. 239
    • Pagura, C.1    Daolio, S.2    Facchin, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.