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Journal of Materials Science: Materials in Electronics

Volumn 20, Issue SUPPL. 1, 2009, Pages

Spectroscopic ellipsometry study of In 2O 3 thin films

(4) Miao, L a Tanemura, S a Cao, Y G b Xu, G a,c

a JAPAN FINE CERAMICS CENTER (Japan)

b FUJIAN INSTITUTE OF RESEARCH ON THE STRUCTURE OF MATTER (China)

c GUANGZHOU INSTITUTE OF ENERGY CONVERSION (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SAMPLES; BRUGGEMAN EFFECTIVE MEDIUM APPROXIMATION; CONFIGURATION MODEL; CUBIC CRYSTAL STRUCTURES; CURVE SHAPE; DISPERSION FORMULAS; DOUBLE-LAYERED FILMS; ENERGY RANGES; EXTINCTION COEFFICIENTS; OPTICAL TRANSITION MODE; POLYCRYSTALLINE; SUBSTRATE TEMPERATURE; SURFACE LAYERS;

CRYSTAL STRUCTURE; FILM PREPARATION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY;

AMORPHOUS FILMS;

EID: 71049152406 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/S10854-007-9447-6 Document Type: Conference Paper

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.