Vertical Plasmonic Mach-Zehnder interferometer for sensitive optical sensing

Optics Express

Volumn 17, Issue 23, 2009, Pages 20747-20755

  Gan, Qiaoqiang ^a   Gao, Yongkang ^a   Bartoli, Filbert J ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT SCATTERING; INTERFEROMETERS; MACH-ZEHNDER INTERFEROMETERS; OPTICAL SWITCHES;

BROAD-BAND OPTICAL SOURCES; FAR-FIELD SCATTERING; HIGH SENSITIVITY; INTERFERENCE PATTERNS; SUBWAVELENGTH SLITS; SURFACE PLASMON MODES; ULTRA SENSITIVES; WAVELENGTH SHIFT;

PLASMONS;

METAL; NANOMATERIAL;

ARTICLE; CHEMISTRY; GENETIC PROCEDURES; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; NANOTECHNOLOGY; OPTICS; OSCILLOMETRY; RADIATION SCATTERING; REFRACTOMETRY; STATISTICAL MODEL; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

BIOSENSING TECHNIQUES; INTERFEROMETRY; METALS; MODELS, STATISTICAL; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS AND PHOTONICS; OSCILLOMETRY; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 70749160941     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.020747     Document Type: Article

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