Temperature dependence of resistivity and Hall coefficient in strongly disordered NbN thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 13, 2009, Pages

  Chand, Madhavi ^a   Mishra, Archana ^a,b   Xiong, Y M ^c   Kamlapure, Anand ^a   Chockalingam, S P ^a   Jesudasan, John ^a   Bagwe, Vivas ^a   Mondal, Mintu ^a   Adams, P W ^c   Tripathi, Vikram ^a   Raychaudhuri, Pratap ^a  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY ROORKEE   (India)

^c LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70749130985     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.134514     Document Type: Article

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