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Volumn 34, Issue 22, 2009, Pages 3538-3540

Wide-field optical nanoprofilometry using structured illumination

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; LIGHT MODULATION; LIGHT MODULATORS; LIQUID CRYSTALS; SENSITIVITY ANALYSIS;

EID: 70749112271     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.003538     Document Type: Article
Times cited : (23)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.