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Volumn 34, Issue 22, 2009, Pages 3538-3540
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Wide-field optical nanoprofilometry using structured illumination
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
LIGHT MODULATION;
LIGHT MODULATORS;
LIQUID CRYSTALS;
SENSITIVITY ANALYSIS;
DEPTH SENSITIVITY;
HEIGHT MEASUREMENT;
LATERAL RESOLUTION;
LIQUID CRYSTAL SPATIAL LIGHT MODULATORS;
STRUCTURED ILLUMINATION;
STRUCTURED ILLUMINATION MICROSCOPY;
SUB-DIFFRACTION LIMIT;
SUPER RESOLUTION IMAGING;
DEPTH PROFILING;
GLASS;
GOLD;
SILICON;
ARTICLE;
CHEMISTRY;
ILLUMINATION;
NANOTECHNOLOGY;
OPTICAL INSTRUMENTATION;
SURFACE PROPERTY;
GLASS;
GOLD;
LIGHTING;
NANOTECHNOLOGY;
OPTICAL DEVICES;
SILICON;
SURFACE PROPERTIES;
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EID: 70749112271
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.34.003538 Document Type: Article |
Times cited : (23)
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References (16)
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