XRD and TEM characterizations of the mechanically alloyed CuIn0.5Ga0.5Se2 powders

Journal of Alloys and Compounds

Volumn 489, Issue 2, 2010, Pages 437-440

  Benslim, N ^a   Mehdaoui, S ^a   Aissaoui, O ^a   Benabdeslem, M ^a   Bouasla, A ^a   Bechiri, L ^a   Otmani, A ^b   Portier, X ^c  

^a BADJI MOKHTAR UNIVERSITY   (Algeria)

^b UNIVERSITY OF SKIKDA   (Algeria)

^c Direction de la Recherche Fondamentale   (France)

Author keywords

Chalcopyrite; Nanoparticule; Semiconductors; Transmission electron microscopy

Indexed keywords

COPPER COMPOUNDS; CRYSTALLITE SIZE; GALLIUM ALLOYS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDIUM ALLOYS; MECHANICAL ALLOYING; MILLING (MACHINING); NANOCRYSTALLINE POWDERS; NANOCRYSTALS; POWDERS; SEMICONDUCTOR ALLOYS; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CHALCOPYRITE; CHALCOPYRITE STRUCTURES; MECHANICAL ALLOYING METHOD; MECHANICALLY ALLOYED; NANOPARTICULE; TEM CHARACTERIZATION; UNIT CELL PARAMETERS; X-RAY DIFFRACTION MEASUREMENTS;

COPPER ALLOYS;

EID: 70649100006     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.09.148     Document Type: Review

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