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Journal of Applied Physics

Volumn 106, Issue 9, 2009, Pages

Nonlinear refraction properties of nickel oxide thin films at 800 nm

(5) De Melo, Ronaldo P a,b Da Silva, Blenio J P a Dos Santos, Francisco Eroni P a Azevedo, A a De Araújo, Cid B a

a FEDERAL UNIVERSITY OF PERNAMBUCO (Brazil)

b Ex rcito Brasileiro (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

NICKEL FILM; NICKEL OXIDE THIN FILMS; NON-LINEAR REFRACTION; NONLINEAR ABSORPTIONS; NONLINEAR MEASUREMENT; NONLINEAR REFRACTIVE INDEX; OPTICAL QUALITIES; SODA LIME GLASS; STRUCTURE AND MORPHOLOGY; X RAY DIFFRACTOMETRY; Z-SCAN TECHNIQUE;

ATOMIC FORCE MICROSCOPY; FILM PREPARATION; NICKEL; NICKEL ALLOYS; NICKEL OXIDE; NONLINEAR OPTICS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

OXIDE FILMS;

EID: 70450280485 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3254233 Document Type: Article

Times cited : (28)

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