Comment on "influence of atomic force microscope cantilever tilt and induced torque on force measurements" [J. Appl. Phys. 103, 064513 (2008)]

Journal of Applied Physics

Volumn 106, Issue 9, 2009, Pages

  Wang, Fei ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; CANTILEVER TILT; PRACTICAL MODEL; SHARP TIP; SPHERICAL PROBES; SPRING CONSTANTS;

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS; PROBES;

FORCE MEASUREMENT;

EID: 70450236991     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3257268     Document Type: Article

References (4)

1. S. A. Edwards, W. A. Ducker, and J. E. Edwards, J. Appl. Phys. 0021-8979 103, 064513 (2008). 10.1063/1.2885734
2. P. Attard, A. Carambassis, and M. W. Rutland, Langmuir 0743-7463 15, 553 (1999). 10.1021/la980848p
3. L.-O. Heim, M. Kappl, and H. J. Butt, Langmuir 0743-7463 20, 2760 (2004). 10.1021/la036128m
4. J. L. Hutter, Langmuir 0743-7463 21, 2630 (2005). 10.1021/la047670t (Pubitemid 40421918)