A robust method for processing scanning probe microscopy images and determining nanoobject position and dimensions

Journal of Microscopy

Volumn 236, Issue 3, 2009, Pages 211-218

  Silly, F ^a,b,c,d,e  

^a CNRS   (France)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d LINKÖPING UNIVERSITY   (Sweden)

^e UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

Algorithm; Dimension; FabViewer; Image processing; Nanoobject; Position; Scanning probe microscopy

Indexed keywords

HYDROPHOBICITY; IMAGE ENHANCEMENT; LEAST SQUARES APPROXIMATIONS; PATTERN RECOGNITION;

DIMENSION; FABVIEWER; IMAGE PATTERNS; IMAGES PROCESSING; MICROSCOPY IMAGES; NANO-OBJECTS; NANOSCALE PHENOMENON; POSITION; ROBUST METHODS; SCANNING-PROBE MICROSCOPY;

SCANNING PROBE MICROSCOPY;

NANOCRYSTAL;

ACCURACY; ALGORITHM; ANALYTIC METHOD; ARTICLE; IMAGE PROCESSING; NANOANALYSIS; PATTERN RECOGNITION; PRIORITY JOURNAL; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY;

EID: 70450193541     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03191.x     Document Type: Article

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