|
Volumn 97, Issue 4, 2009, Pages 741-744
|
Investigation on optical properties of Bi2.85La 0.15TiNbO9 thin films by prism coupling technique
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BRILLOUIN;
ELECTRO-OPTICAL ACTIVE MATERIALS;
FILM HOMOGENEITY;
FILM-SUBSTRATE INTERFACES;
FUSED SILICA SUBSTRATES;
OPTICAL PRISM;
OPTICAL WAVEGUIDING;
PRISM COUPLING TECHNIQUE;
TRANSVERSE ELECTRICS;
TRANSVERSE MAGNETIC MULTIMODES;
WAVE-GUIDING;
WAVELENGTH RANGES;
DEPOSITION;
FUSED SILICA;
LIGHT MEASUREMENT;
LIGHT REFRACTION;
ORGANIC POLYMERS;
OXIDE MINERALS;
PEROVSKITE;
PRISMS;
PULSED LASER DEPOSITION;
REFRACTIVE INDEX;
REFRACTOMETERS;
SILICA;
SUBSTRATES;
THIN FILMS;
WAVEGUIDES;
X RAY DIFFRACTION;
OPTICAL FILMS;
|
EID: 70450161720
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s00339-009-5421-x Document Type: Article |
Times cited : (3)
|
References (15)
|