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Volumn , Issue , 2009, Pages 932-936

Advanced chip to wafer bonding: A flip chip to wafer bonding technology for high volume 3DIC production providing lowest cost of ownership

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY YIELDS; BONDING PROCESS; COST OF OWNERSHIP; DIE STACK; ELECTRICAL DEVICES; FLIP CHIP; HIGH-VOLUME PRODUCTION; HIGHLY INTEGRATED; LOW COSTS; ON-WAFER; ORDER OF MAGNITUDE; PROCESS FLOWS; SEMICONDUCTOR CHIPS; SOLDER BUMPING; SOLDER VOLUME; SYSTEM IN PACKAGE; TRANSISTOR SIZE; TWO-STEP PROCESS; WAFER BONDING PROCESS; WAFER LEVEL; WAFERBONDING TECHNOLOGY;

EID: 70449813272     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2009.5270559     Document Type: Conference Paper
Times cited : (3)

References (13)
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  • 5
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    • Nov
    • "Sony Leads the Industry in Mass Production Devices that Achieve the Same Performance as embedded DRAM LSIs in the Low-Cost SiP Process," CX-News, Vol. 50, Nov. 2007, http://www.sony.net/Products/SC-HP/cx-news.
    • (2007) CX-News , vol.50
  • 7
    • 50949090622 scopus 로고    scopus 로고
    • S. Pozder, A. Jain, R. Chatterjee, Z. Huang, R. E. Jones, E. Acosta, B. Marlin, G. Hillmann, M. Sobczak, G. Kreindl, S. Kanagavel, H. Kostner and S. Pargfrieder, 3D Die-to-wafer Cu/Sn Microconnects Formed Simultaneously with an Adhesive Dielectric Bond Using Thermal Compression Bonding, Interconnect Technology Conference, IITC International, Burlingame, CA, USA, pp. 46, 2008.
    • S. Pozder, A. Jain, R. Chatterjee, Z. Huang, R. E. Jones, E. Acosta, B. Marlin, G. Hillmann, M. Sobczak, G. Kreindl, S. Kanagavel, H. Kostner and S. Pargfrieder, "3D Die-to-wafer Cu/Sn Microconnects Formed Simultaneously with an Adhesive Dielectric Bond Using Thermal Compression Bonding," Interconnect Technology Conference, IITC International, Burlingame, CA, USA, pp. 46, 2008.
  • 8
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    • Controlled Collapse Reflow Chip Joining
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  • 9
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    • Homepage of EVGroup, http://www.evgroup.com.
  • 10
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  • 13
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    • nd European Conference & Exhibition on Integration Issues of Miniaturized Systems-MOMS, MOEMS, ICs and Electronic Components, Smart System Integration, Barcelona, 2008.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.