Alkaline earth versus noble metal particles on mgo thin films: Growth and optical properties

Journal of Physical Chemistry C

Volumn 113, Issue 43, 2009, Pages 18740-18745

  Myrach, Philipp ^a   Nilius, Niklas ^a   Freund, Hans Joachim ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALINE EARTH; AU PARTICLES; CHEMICAL IDENTITY; DOUBLE BARRIERS; ELECTRON TRANSPORT; FINE STRUCTURES; HEXAGONAL PARTICLES; METAL PARTICLE; MGO SURFACES; MGO THIN FILMS; NOBLE-METAL PARTICLES; NUCLEATION AND GROWTH; OXIDE LATTICES; PARTICLE MATERIALS; PARTICLE PLASMONS; PHOTON EMISSIONS; PLASMON RESPONSE; SCANNING TUNNELING MICROSCOPY (STM); SPECTRAL CONTRIBUTION; SPECTRAL SHAPES;

CALCIUM; GOLD; LIGHT METALS; MAGNETIC TAPE; OPTICAL DATA STORAGE; OPTICAL PROPERTIES; PHOTONS; PLASMONS; PRECIOUS METALS; SCANNING TUNNELING MICROSCOPY;

INTEGRATED OPTOELECTRONICS;

EID: 70449589224     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp904174c     Document Type: Article

References (38)

1. Kreibig U.; Vollmer W. Optical Properties of Metal Clusters, Springer Series Materials Science; Springer: Berlin, 1995, Vol. 25.
2. Watanabe, K.; Menzel, D.; Nilius, N.; Freund, H.-J. Chem. Rev. 2006, 106, 4301.
3. Bréchignac, C.; Cahuzac, Ph.; Kebaïli, N.; Leygnier, J.; Sarfati, A. Phys. Rev. Lett. 1992, 68, 3916.
4. Kolwas, K.; Demianiuk, S.; Kolwas, M. J. Chem. Phys. 1997, 106, 8436.
5. Beitia, C.; Borensztein, Y.; Barrera, R. G.; Roman-Velazquz, C. E.; Noguez, C. Physica B 2000, 279, 25.
6. Liebsch, A. Phys. Rev. B 1993, 48, 11317.
7. Kittel C. Introduction to Solid State Physics; Wiley: New York, 1996.
8. Ekardt W., Ed. Metal Clusters; Wiley: Chichester, 1999.
9. Solov'yov, I. A.; Solov'yov, A. V.; Greiner, W. J. Phys. B: At. Mol. Opt. Phys. 2004, 37, L137.
10. Tiggesbäumker, J.; Köller, L.; Meiwes-Broer, K. H.; Liebsch, A. Phys. Rev. A 1993, 48, R17490.
11. Nilius, N.; Ernst, N.; Freund, H.-J. Phys. Rev. Lett., 2000, 84, 3994.
12. Berndt, R. Scanning Probe Microscopy; Wiesendanger, R., Ed.; Springer Series Nanoscience and Technology; Springer: Berlin, 1998, p 97.
13. Benten, W.; Nilius, N.; Ernst, N.; Freund, H.-J. Phys. Rev. B. 2005, 72, 045403.
14. Nilius, N.; Cörper, A.; Bozdech, G.; Ernst, N.; Freund, H.-J. Prog. Surf. Sci. 2001, 67, 99.
15. Benedetti, S.; Benia, H. M.; Nilius, N.; Valeri, S.; Freund, H.-J. Chem. Phys. Lett. 2006, 430, 330.
16. Wollschläger, J.; Erdos, D.; Goldbach, H.; Hopken, R.; Schröder, K. M. Thin Sol. Films 2001, 400, 1.
17. Benedetti, S.; Torelli, P.; Luches, P.; Valeri, S.; Benia, H. M.; Nilius, N.; Renaud, G. Phys. Rev.B 2008, 78, 195411.
18. Benia, H. M.; Nilius, N.; Freund, H.-J. Surf. Sci. Lett. 2007, 601, L55.
19. Benia, H. M.; Myrach, P.; Nilius, N. New J. Phys. 2008, 10, 013010.
20. Sterrer, M.; Heyde, M.; Nowicki, M.; Nilius, N.; Risse, T.; Rust, H.-P.; Pacchioni, G.; Freund, H.-J. J. Phys. Chem. B 2006, 110, 46.
21. Benia, H. M.; Lin, X.; Gao, H. J.; Nilius, N.; Freund, H.-J. J. Phys. Chem. C 2007, 111, 10528.
22. 2 from the rest gas or Mo support.
23. Zhu, J.; Farmer, J. A.; Ruzycki, N.; Xu, L.; Campbell, C. T.; Henkelman, G. J. Am. Chem. Soc. 2008, 130, 2314.
24. Sterrer, M.; Risse, T.; Heyde, M.; Rust, H.-P.; Freund, H.-J. Phys. Rev. Lett. 2007, 98, 206103.
25. Pacchioni, G.; Giordano, L.; Baistrocchi, M. Phys. Rev. Lett. 2005, 94, 226104.
26. Yudanov, I.; Pacchioni, G.; Neyman, K.; Rosch, N. J. Phys. Chem. B 1997, 101, 2786.
27. Del Vitto, A.; Pacchioni, G.; Delbecq, F. O.; Sautet, P. J. Phys. Chem. B 2005, 109, 8040.
28. Xu, L.; Henkelman, G. Phys. Rev. B 2008, 77, 205404.
29. Palik E. D. Handbook of Optical Constants of Solids; Academic: Orlando, FL, 1985.
30. Downes, A.; Welland, M. E. Appl. Phys. Lett. 1998, 72, 2671.
31. Johansson, P.; Monreal, R.; Apell, P. Phys. Rev. B 1990, 42, 9210.
32. Anisimovas, E.; Johansson, P. Phys. Rev. B. 1999, 59, 5126.
33. The two-step nature of electron transport through a single particle gives rise to Coulomb charging effects in the differential conductance, which were however not resolved at the high bias voltage used for optical excitations.
34. Chen J. C. Introduction to Scanning Tunneling Microscopy: Oxford University Press: New York, 1993.
35. Giordano, L.; Cinquini, F.; Pacchioni, G. Phys. Rev. B 2005, 73, 045414.
36. Gundlach, K. H. Sol. Stat. Electron 1966, 9, 949.
37. Binnig, G.; Frank, K. H.; Fuchs, H.; Garcia, N.; Reihl, B.; Rohrer, H.; Salvan, F.; Williams, A. R. Phys. Rev. Lett. 1985, 55, 991.
38. Kolesnychenko, O. Y.; Kolesnichenko, Y. A.; Shklyarevskii, O. I.; van Kempen, H. Physica B 2000, 291, 246.