Field-emission resonance measurements with mechanically controlled break junctions

Physica B: Condensed Matter

Volumn 291, Issue 3-4, 2000, Pages 246-255

  Kolesnychenko, O Yu ^a   Kolesnichenko, Yu A ^b   Shklyarevskii, O I ^a,b   Van Kempen, H ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY;

FIELD EMISSION RESONANCE; GUNDLACH OSCILLATIONS; VACUUM TUNNELING; WORK FUNCTION;

SEMICONDUCTOR JUNCTIONS;

EID: 0034274419     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02884-7     Document Type: Article

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