Influence of SiO2 addition on the dielectric properties and microstructure of (Ba0.96Ca0.04)(Ti0.85 Zr0.15)O3 ceramics

International Journal of Applied Ceramic Technology

Volumn 6, Issue 6, 2009, Pages 692-701

  Lee, Ying Chieh ^a   Lin, Chia Wei ^a   Lu, Wei Hua ^a   Chen, Wen Jauh ^b   Lee, Wen Hsi ^c  

^a NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BCTZ CERAMICS; CRYSTALLINE PHASE; HIGH DENSITY; REDUCING ATMOSPHERE; SECOND PHASE; SINTERED CERAMICS; SINTERING BEHAVIORS; SINTERING TEMPERATURES; SOLID STATE METHOD; TIO; UNIFORM GRAIN SIZE;

BARIUM; CALCIUM; CERAMIC CAPACITORS; CERAMIC MATERIALS; DOPING (ADDITIVES); MICROSTRUCTURE; SILICA; SINTERING; THICK FILMS; ZIRCONIUM;

DIELECTRIC PROPERTIES;

EID: 70449387271     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2009.02379.x     Document Type: Article

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