Experimental Iinvestigation of scaling effect on thermal transport in nanoscale hot spots

Nanoscale and Microscale Thermophysical Engineering

Volumn 13, Issue 4, 2009, Pages 203-217

  Etessam Yazdani, Keivan ^a   Asheghi, Mehdi ^b   Hamann, Hendrik F ^c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Stanford University   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Localized heating; Silicon chip; Subcontinuum heat transport

Indexed keywords

ANALYTICAL SOLUTIONS; ELECTRICAL RESISTANCES; EXPERIMENTAL INVESTIGATIONS; HOT SPOT; INTERFACE RESISTANCE; LOCALIZED HEATING; NANO SCALE; NANOHEATERS; SCALING EFFECTS; SILICON CHIP; SILICON SUBSTRATES; SINGLE CRYSTALLINE SILICON; SIZE DEPENDENCY; SUBCONTINUUM HEAT TRANSPORT; THERMAL RESISTANCE; THERMAL TRANSPORT;

PLATINUM;

HEATING;

EID: 70449333338     PISSN: 15567265     EISSN: None     Source Type: Journal    
DOI: 10.1080/15567260903276908     Document Type: Article

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