|
Volumn 12, Issue 10, 2009, Pages 42-45
|
New carbon nanotube AFM probe technology
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ADVANCED MATERIALS;
AFM PROBE;
RAPID EVOLUTION;
SAMPLE SURFACE;
SHARP TIP;
CARBON NANOTUBES;
PROBES;
ATOMIC FORCE MICROSCOPY;
|
EID: 70350769341
PISSN: 13697021
EISSN: None
Source Type: Journal
DOI: 10.1016/S1369-7021(09)70276-7 Document Type: Article |
Times cited : (31)
|
References (6)
|