Experimental study on power consumption in lifetime engineered power diodes

IEEE Transactions on Electron Devices

Volumn 56, Issue 11, 2009, Pages 2819-2824

  Daliento, Santolo ^a   Mele, Luigi ^a   Spirito, Paolo ^a   Carta, Rossano ^b   Merlin, Luigi ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b Vishay   (United States)

Author keywords

Helium; Lifetime; Platinum; Power diodes

Indexed keywords

COMBINED EFFECT; ENERGY CONSUMPTION; ENGINEERING TREATMENT; EXPERIMENTAL STUDIES; HELIUM IMPLANTATION; LIFETIME; POWER CONSUMPTION; POWER DIODE; POWER DIODES; QUANTITATIVE STUDY; SWITCHING OPERATIONS;

DIODES; HELIUM; PLATINUM; SOLID-STATE SENSORS;

SPECIAL EFFECTS;

EID: 70350728658     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2031005     Document Type: Article

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