Modeling defects of PV-cells by mean of FEM

2009 International Conference on Clean Electrical Power, ICCEP 2009

Volumn , Issue , 2009, Pages 52-56

  Vergura, S ^a   Acciani, G ^a   Falcone, O ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

Cell; Defects; Photovoltaic; Thermography

Indexed keywords

CELL EFFICIENCY; EDGE SHUNT; MULTI-PHYSICS; PHOTOVOLTAIC; SIMULATION RESULT; THERMOGRAPHY;

ELECTRIC POWER SUPPLIES TO APPARATUS; FINITE ELEMENT METHOD; REMOTE SENSING; SIMULATORS; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

DEFECTS;

EID: 70350719585     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCEP.2009.5212084     Document Type: Conference Paper

References (6)

1. Breitenstein O., Rakotoniaina JP, Al Rifai M.H., Werner M. "Shunt type in crystalline solar cells", Progress in photovoltaics research and application, 2004, 12, pag. 532
2. A. S. Vergura, G. Acciani, O. Falcone, "3-D PV-cell Model by means of FEM", submitted to IEEE-ICCEP 2009, Capri, Italy
3. Breitenstein O., Langenkamp M, Rakotoniaina JP, Zettner J., "The imaging of shunts in solar cells by infrared lock-in thermography". Proceedings of the 17th European Photovoltaic Solar Energy Conference, Munich, 2002; pp. 1499-1502
4. Breitenstein O., Langenkamp M, Lang O., Schirrmacher, "A. Shunts due to laser scribing of solar cell evaluated by highly sensitive lock-in thermography", Solar Energy and Solar Cells, 2001; pp. 55-62
5. Rakotoniaina JP., Neve S, Werner M, Breitenstein O., "Material induced shunts in multicrystalline silicon solar cells", Proceedings of the Conference on PV in Europe, Rome, 2002; pp. 24-27
6. Breitenstein O., Rakotoniaina JP, Al Rifai M.H., "Quantitative evaluation of shunts in solar cells by lock-in thermography", Progress in photovoltaics research and application, 2003, vol. 11, pp. 515-526