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Applied Physics A: Materials Science and Processing

Volumn 96, Issue 4, 2009, Pages 1027-1033

Nanostructuring of FePt thin films by plasma focus device: Pulsed ion irradiation dependent phase transition and magnetic properties

(7) Pan, Z Y a Rawat, R S a Lin, J J a Zhang, T b Lee, P a Tan, T L a Springham, S V a

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; ANNEALING TEMPERATURES; COERCIVITIES; CONVENTIONAL ANNEALING; EASY AXIS; EXCESSIVE ENERGY; FEPT THIN FILMS; ION IRRADIATION; IRRADIATED SAMPLES; LATTICE DISTORTIONS; NANO-STRUCTURING; ORDERS OF MAGNITUDE; PLASMA FOCUS; PLASMA FOCUS DEVICES; PULSED LASER; PULSED PLASMA; SINGLE SHOTS; TEXTURE COEFFICIENT; THERMAL TREATMENT;

ANNEALING; COERCIVE FORCE; ENERGY TRANSFER; IONS; IRRADIATION; PHASE TRANSITIONS; PLASMA DEVICES; PULSED LASER DEPOSITION; THIN FILMS;

PLASMAS;

EID: 70350567756 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-009-5138-x Document Type: Article

Times cited : (21)

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