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Volumn , Issue , 2009, Pages 508-513
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High-speed position tracking for nanohandling inside scanning electron microscopes
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTATIONAL OVERHEADS;
DEFOCUSING;
HIGH RESOLUTION SENSORS;
HIGH-SPEED;
NANOHANDLING;
NEW POSITION;
OPTICAL ENCODER;
POSITION TRACKING;
POSITION TRACKING SYSTEM;
SCANNING ALGORITHMS;
SCANNING ELECTRON MICROSCOPE;
STRUCTURED PATTERNS;
TRACKING SYSTEM;
TUNGSTEN CATHODES;
WORKING RANGE;
ELECTRON MICROSCOPES;
IMAGE ACQUISITION;
NAVIGATION;
ROBOTICS;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
TUNGSTEN;
TRACKING (POSITION);
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EID: 70350366413
PISSN: 10504729
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ROBOT.2009.5152489 Document Type: Conference Paper |
Times cited : (15)
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References (6)
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