Continuous self-imaging regime with a double-grating mask

Applied Optics

Volumn 48, Issue 30, 2009, Pages 5722-5727

  Sanchez Brea, Luis Miguel ^a   Torcal Milla, Francisco Jose ^a   Bernabeu, Eusebio ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CONTOUR MEASUREMENT; FITS AND TOLERANCES;

AMPLITUDE GRATINGS; EXPERIMENTAL VERIFICATION; INTENSITY DISTRIBUTION; MECHANICAL TOLERANCES; MONOCHROMATIC LIGHT; OBSERVATION PLANES; SPATIAL FREQUENCY; TALBOT EFFECTS;

DIFFRACTION GRATINGS;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; CONTRAST SENSITIVITY; EQUIPMENT DESIGN; IMAGE PROCESSING; LIGHT; METHODOLOGY; OPTICS; PATTERN RECOGNITION; REFRACTOMETRY;

CONTRAST SENSITIVITY; EQUIPMENT DESIGN; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHT; OPTICS AND PHOTONICS; PATTERN RECOGNITION, VISUAL; REFRACTOMETRY;

EID: 70350290301     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.005722     Document Type: Article

References (13)

1. E. Keren and O. Kafri, "Diffraction effects in moiré deflectometry," J. Opt. Soc. Am. A 2 (2), 111-120 (1985).
2. A. W. Lohmann and D. E. Silva, "An interferometer based on the Talbot effect," Opt. Commun. 2, 413-415 (1971).
3. B. F. Oreb and R. G. Dorsch "Profilometry by phase-shiftedTalbot images," Appl. Opt. 33, 7955-7962 (1994).
4. S. Wei, S. Wu, I. Kao, and F. P. Chiang "Measurement of wafer surface using shadow moire technique with Talbot effect," J. Electron. Packag. 120 166-170 (1998).
5. G. Schirripa Spagnolo, D. Ambrosini, and D. Paoletti, "Displacement measurement using the Talbot effect with a Ronchi grating," J. Opt. A Pure Appl. Opt. 4, S376-S380 (2002).
6. W. H. F. Talbot, "Facts relating to optical science," Philos. Mag. 9, 401-407 (1836).
7. K. Patorski, "The self-imaging phenomenon and its applications," in Progress in Optics, E. Wolf, ed. (North-Holland, 1989), Vol.27, pp. 1-108.
8. N. Guérineau, B. Harchaoui, and J. Primot, "Talbot experiment re-examined: demonstration of an achromatic and continuous self-imaging regime," Opt. Commun. 180, 199-203 (2000).
9. L. M.Sanchez-Brea, J. Saez-Landete, J. Alonso, and E. Bernabeu "Invariant grating pseudo-imaging using polychromatic light and finite extension source," Appl. Opt. 47, 1470-1477 (2008).
10. L. M. Sanchez-Brea, J. Alonso, and E. Bernabeu "Quasicontinuous pseudoimages for sinusoidal grating imaging using an extended light source," Opt. Commun. 236 53-58 (2004).
11. G. Vincent, R. Haidar, S. Collin, N. Guérineau, J. Primot, E. Cambril, and J. L. Pelouard "Realization of sinusoidal transmittance with subwavelength metallic structures," J. Opt. Soc. Am. B 25, 834-840 (2008).
12. K. Patorsky, Handbook of the Moiré Fringe Technique (Elsevier, 1993).
13. D. Crespo, J. Alonso, and E. Bernabeu, "Generalized grating imaging using an extended monochromatic light source," J. Opt. Soc. Am. A 17, 1231-1240 (2000).