High-temperature annealing effects on multiwalled carbon nanotubes: Electronic structure, field emission and magnetic behaviors

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 12, 2009, Pages 6799-6805

  Ray, Sekhar Chandra ^a,b   Pao, Chih Wen ^a   Tsai, Huang Ming ^a   Chen, Huang Chin ^a   Chen, Yu Shin ^a   Wu, Shang Lun ^a   Ling, Dah Chin ^a   Lin, I Nan ^a   Pong, Way Faung ^a   Gupta, Sanju ^c   Giorcelli, Mauro ^c   Bianco, Stefano ^c   Musso, Simone ^c   Tagliaferro, Alberto ^c  

^a TAMKANG UNIVERSITY   (Taiwan)

^b DEPARTMENT OF MATERIALS SCIENCE   (India)

^c POLITECNICO DI TORINO   (Italy)

Author keywords

Electron field emission; Electronic structure; Magnetization; Mwcnts; Thermal annealing

Indexed keywords

AS-GROWN; BULK COUNTERPART; COERCIVITIES; ELECTRON FIELD EMISSION; HIGH-TEMPERATURE ANNEALING; IN-FIELD; IRON NANOPARTICLES; MAGNETIC BEHAVIOR; MAGNETIZATION BEHAVIOR; MICRO RAMAN SPECTROSCOPY; MWCNTS; OXYGEN CONTENT; OXYGEN GAS; RECORDING MEDIA; THERMAL ANNEALING; TURN-ON ELECTRIC FIELD; VALENCE-BAND PHOTOEMISSION SPECTROSCOPY; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES;

ABSORPTION SPECTROSCOPY; ANNEALING; CARBON NANOTUBES; ELECTRIC FIELDS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ELECTRONS; EMISSION SPECTROSCOPY; FIELD EMISSION; GAS ABSORPTION; GRAPHITE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAKAGE (FLUID); MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETS; MICROWAVE TUBES; MULTIWALLED CARBON NANOTUBES (MWCN); OXYGEN; RAMAN SPECTROSCOPY; X RAY ANALYSIS;

FIELD EMISSION DISPLAYS;

EID: 70350247860     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.1581     Document Type: Article

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