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Volumn 12, Issue 12, 2009, Pages

Effect of interfacial properties of p-GaN/sputter-deposited NiAg-based electrode on optical properties of vertical GaN-based LEDs

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION STRENGTHS; GAN BASED LED; IN-DIFFUSION; INTERFACIAL ADHESION STRENGTH; INTERFACIAL ADHESIONS; INTERFACIAL PROPERTY; NI ATOMS; OUTPUT POWER; VERTICAL GAN-BASED LIGHT EMITTING DIODES;

EID: 70350047077     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3238468     Document Type: Article
Times cited : (6)

References (10)
  • 1
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    • (1998) Applied Physics Letters , vol.72 , Issue.5 , pp. 599-601
    • Wong, W.S.1    Sands, T.2    Cheung, N.W.3
  • 3
    • 17644406361 scopus 로고    scopus 로고
    • Low-resistance Al-based reflectors for high-power GaN-based flip-chip light-emitting diodes
    • DOI 10.1063/1.1894614, 133503
    • J. -O. Song, W. K. Hong, Y. Park, J. S. Kwak, and T. -Y. Seong, Appl. Phys. Lett. 0003-6951, 86, 133503 (2005). 10.1063/1.1894614 (Pubitemid 40564927)
    • (2005) Applied Physics Letters , vol.86 , Issue.13 , pp. 1-3
    • Song, J.-O.1    Hong, W.-K.2    Park, Y.3    Kwak, J.S.4    Seong, T.-Y.5
  • 4
    • 31344441747 scopus 로고    scopus 로고
    • Effect of resonant cavity in wafer-bonded green InGaN LED with dielectric and silver mirrors
    • DOI 10.1109/LPT.2005.863177
    • R. -H. Horng, Y. -K. Wang, S. -Y. Huang, and D. S. Wuu, IEEE Photonics Technol. Lett. 1041-1135, 18, 457 (2006). 10.1109/LPT.2005.863177 (Pubitemid 43137953)
    • (2006) IEEE Photonics Technology Letters , vol.18 , Issue.3 , pp. 457-459
    • Horng, R.-H.1    Wang, W.-K.2    Huang, S.-Y.3    Wuu, D.-S.4
  • 6
    • 0027840967 scopus 로고
    • 0261-8028,. 10.1007/BF00882542
    • A. Wehr and A. Barcz, J. Mater. Sci. Lett. 0261-8028, 12, 1920 (1993). 10.1007/BF00882542
    • (1993) J. Mater. Sci. Lett. , vol.12 , pp. 1920
    • Wehr, A.1    Barcz, A.2
  • 7
    • 0026971618 scopus 로고
    • Some experimental facts about temperature-induced surface diffusion of Ag during Auger sputter depth profiling of multilayerd Ni/Ag thin films
    • DOI 10.1016/0042-207X(92)90018-R
    • N. Tanovic, L. Tanovic, and J. Fine, Vacuum 0042-207X, 43, 1177 (1992). 10.1016/0042-207X(92)90018-R (Pubitemid 23614696)
    • (1992) Vacuum , vol.43 , Issue.12 , pp. 1177-1180
    • Tanovic, N.1    Tanovic, L.2    Fine, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.