Transformation invariance in pattern recognition: Tangent distance and propagation

International Journal of Imaging Systems and Technology

Volumn 11, Issue 3, 2000, Pages 181-197

  Simard, Patrice Y ^a   Le Cun, Yann A ^b   Denker, John S ^b   Victorri, Bernard ^c  

^a MICROSOFT RESEARCH   (United States)

^b AT AND T LABS RESEARCH   (United States)

^c UMR 8094   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; REGRESSION ANALYSIS; VECTORS;

TANGENT VECTORS;

PATTERN RECOGNITION;

EID: 0034467942     PISSN: 08999457     EISSN: None     Source Type: Journal    
DOI: 10.1002/1098-1098(2000)11:3<181::AID-IMA1003>3.0.CO;2-E     Document Type: Article

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