Three-dimensional characterization of fatigue cracks in Ti-6246 using X-ray tomography and electron backscatter diffraction

Acta Materialia

Volumn 57, Issue 19, 2009, Pages 5834-5847

  Birosca, S ^a   Buffiere, J Y ^b   Garcia Pastor, F A ^a   Karadge, M ^a   Babout, L ^b   Preuss, M ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

EBSD; Fatigue; Microstructure; Titanium alloy; X ray tomography

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; FATIGUE CRACK PROPAGATION; FATIGUE OF MATERIALS; GRAIN BOUNDARIES; IMAGING SYSTEMS; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; SURFACE DEFECTS; SYNCHROTRON RADIATION; TITANIUM ALLOYS; TOMOGRAPHY; X RAYS;

CRYSTALLOGRAPHIC ORIENTATIONS; DIMENSIONAL CHARACTERIZATION; EBSD; ELECTRON BACK SCATTER DIFFRACTION; EUROPEAN SYNCHROTRON RADIATION FACILITIES; TWO-PHASE MICROSTRUCTURES; X RAY MICROTOMOGRAPHY; X-RAY TOMOGRAPHY;

CRACKS;

EID: 70349761361     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.08.009     Document Type: Article

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