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Ballistic quantum transport in a nanoscale metal-oxidesemiconductor field effect transistor
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Failure of Ohm's Law: Its Implications on the Design of Nanoelectronic Devices and Circuits
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0025483563
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Effect of electric-field-induced mobility degradation on the velocity distribution in a sub- mu m length channel of InGaAs/AlGaAs heterojunction MODFET
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in press
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Journal of Applied Physics
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Tan, M.L.P.1
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